Special topic course:
Microscopic elemental analysis methods
Description:
Microscopic physical analysis methods based on beams of radiation play an increasing and key role in many branches of science and technology. Modern scientific research relies increasingly on quantitative measurements to give objective high-quality findings. Modern radiation beam microscopic analysis methods are have inherently quantitative capabilities even when dealing with element concentration imaging in microscopic samples. The course provides training in the radiation-beam methods with an emphasis on how to perform analyses in a quantitative manner. The course covers analysis using the electron microscope, X-ray, and MeV ion beam analysis. Quantitative composition analysis will use as models; Rutherford backscattering Spectrometry (RBS), Particle Induced X-ray Emission (PIXE) and Elastic Recoil Detection Analysis (ERDA) methods.
Lectures
Introduction: Course overview, Concept of radiation-beam analysis of materials, historical development, Structure of matter, Rutherford's planetary model of the atom. Statistical cross-sections as the basis of quantitative particle beam analysis. Solid angle, Basic instrumentation.
Lecture 2
Primary interactions: Energy and momentum transfer in a binary collision. Kinematic factor. Probability of scattering into a given solid angle and differential cross-sections. Energy-loss cross sections. Scattering in a Coulomb potential, the concept of electron screening. Stopping: Mean energy loss, straggling, Bethe formula, Braggs rule for compounds. Use of SRIM code.
Lecture 3
Rutherford Backscattering Spectrometry: Basic principles, Kinematic factor, Energy loss cross section factor, Composition of a compound film. Surface approximation, mean energy approximation. Optimising the energy resolution, Energy loss-cross sections.
Lecture 4
Particle Induced X-ray Emission (PIXE): Basic principles, X-ray spectral notation, basic experiment, X-ray yields and composition. Thin and thick samples. Quantitative analysis of thin samples. Principle of thick target analysis. Relation to EDX analysis and X-ray fluorescence. Elastic Recoil Detection Analysis (ERDA): stopper foil EDX ToF-E ERDA, Off-axis Scanning Transmission Ion Microscopy
Lecture 5
Instrumentation for microprobe analysis: EDX in the scanning electron microscope (EDX), µ-X-ray fluorescence, MeV ion microprobe, microprobe lens systems, a brief introduction to ion accelerators. Charged particle and X-ray detectors, Electronics and detector signal processing.